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1

회의자료

issue
2023 IEEE International Conference on Rebooting Computing (ICRC) Rebooting Computing (ICRC), 2023 IEEE International Conference on. :1-5 Dec, 2023
Author
Short, Jesse
Spear, Matthew
Wilson, Donald
Wahby, William
Xiao, T. Patrick
Jacobs-Gedrim, Robin
Bennett, Christopher
Gilbert, Nad
Agarwal, Sapan
Marinella, Matthew J.
DB Label
Database : IEEE Xplore Digital Library
원문보기
3

회의자료

issue
2022 IEEE International Conference on Rebooting Computing (ICRC) ICRC Rebooting Computing (ICRC), 2022 IEEE International Conference on. :7-12 Dec, 2022
Author
Kim, Joshua E.
Xiao, T. Patrick
Bennett, Christopher H.
Wilson, Donald
Spear, Matthew
Siath, Maximilian
Feinberg, Ben
Agarwal, Sapan
Marinella, Matthew J.
DB Label
Database : IEEE Xplore Digital Library
원문보기
4

회의자료

issue
2022 IEEE International Conference on Rebooting Computing (ICRC) ICRC Rebooting Computing (ICRC), 2022 IEEE International Conference on. :13-23 Dec, 2022
Author
Plagge, Mark
Feinberg, Ben
McFarland, John
Rothganger, Fred
Agarwal, Sapan
Awad, Amro
Hughes, Clayton
Cardwell, Suma G.
DB Label
Database : IEEE Xplore Digital Library
원문보기
7

회의자료

issue
2022 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2022 IEEE International Symposium on. :1205-1209 May, 2022
Author
Clark, Lawrence T.
Duvnjak, Alen
Young-Sciortino, Clifford
Cannon, Matthew
Brunhaver, John
Agarwal, Sapan
Neuendank, Jereme
Wilson, Donald
Barnaby, Hugh
Marinella, Matthew
DB Label
Database : IEEE Xplore Digital Library
원문보기
8

회의자료

issue
2022 IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS) ISPASS Performance Analysis of Systems and Software (ISPASS), 2022 IEEE International Symposium on. :210-220 May, 2022
Author
Nema, Shubham
Kirschner, Justin
Adak, Debpratim
Agarwal, Sapan
Feinberg, Ben
Rodrigues, Arun F.
Marinella, Matthew J.
Awad, Amro
DB Label
Database : IEEE Xplore Digital Library
원문보기
10

회의자료

issue
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2022 6th IEEE. :330-332 Mar, 2022
Author
Marinella, Matthew J.
Xiao, T. Patrick
Feinberg, Ben
Bennett, Chris
Agrawal, Vineet
Puchner, Helmut
Agarwal, Sapan
DB Label
Database : IEEE Xplore Digital Library
원문보기
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