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1

회의자료

issue
2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) Electronics Packaging Technology Conference (EPTC), 2023 IEEE 25th. :340-345 Dec, 2023
Author
Liu, J.M
Yao, J.Z
Wei, Peter
Jiang, Ruby
Pang, Xingshou
Xu, Sean
Li, Leo
DB Label
Database : IEEE Xplore Digital Library
원문보기
3

회의자료

issue
2022 ACM/IEEE 4th Workshop on Machine Learning for CAD (MLCAD) Machine Learning for CAD (MLCAD), 2022 ACM/IEEE 4th Workshop on. :55-61 Sep, 2022
Author
Wu, Bing-Yue
Fang, Shao-Yun
Chang, Hsiang-Wen
Wei, Peter
DB Label
Database : IEEE Xplore Digital Library
원문보기
4

회의자료

issue
2022 18th International Conference on Distributed Computing in Sensor Systems (DCOSS) DCOSS Distributed Computing in Sensor Systems (DCOSS), 2022 18th International Conference on. :93-100 May, 2022
Author
Liu, Yanchen
Nie, Jingping
Xia, Stephen
Sun, Jiajing
Wei, Peter
Jiang, Xiaofan
DB Label
Database : IEEE Xplore Digital Library
원문보기
5

회의자료

issue
2022 21st ACM/IEEE International Conference on Information Processing in Sensor Networks (IPSN) IPSN Information Processing in Sensor Networks (IPSN), 2022 21st ACM/IEEE International Conference on. :15-27 May, 2022
Author
Hou, Kaiyuan
Liu, Yanchen
Wei, Peter
Yang, Chenye
Kang, Hengjiu
Xia, Stephen
Spada, Teresa
Rundle, Andrew
Jiang, Xiaofan
DB Label
Database : IEEE Xplore Digital Library
원문보기
6

회의자료

issue
2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) Biomedical Imaging (ISBI), 2020 IEEE 17th International Symposium on. :337-340 Apr, 2020
Author
Ma, Jeffrey J.
Nakarmi, Ukash
Kin, Cedric Yue Sik
Sandino, Christopher M.
Cheng, Joseph Y.
Syed, Ali B.
Wei, Peter
Pauly, John M.
Vasanawala, Shreyas S.
DB Label
Database : IEEE Xplore Digital Library
원문보기
7

회의자료

issue
2019 20th International Conference on Electronic Packaging Technology(ICEPT) Electronic Packaging Technology(ICEPT), 2019 20th International Conference on. :1-4 Aug, 2019
Author
Li, Lu
Xu, Sean
Liang, Y.k.
Wei, Peter
DB Label
Database : IEEE Xplore Digital Library
원문보기
8

회의자료

issue
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2019 IEEE 26th International Symposium on. :1-9 Jul, 2019
Author
Thin Wei, Peter Chua
Loke Sheng, Foo
Choo, Ng Kim
Serrels, Keith A.
Ku, Kuyt
Lin, Curt
Chih-yi, Tang
DB Label
Database : IEEE Xplore Digital Library
원문보기
10

회의자료

issue
2015 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS) Intelligent Robots and Systems (IROS), 2015 IEEE/RSJ International Conference on. :6121-6128 Sep, 2015
Author
Clingerman, Christopher
Wei, Peter J.
Lee, Daniel D.
DB Label
Database : IEEE Xplore Digital Library
원문보기
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