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전체선택

Compositional Probabilistic Analysis of Temporal Properties Over Stochastic Detectors

학술저널

issue: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 39(11):3288-3299 Nov, 2020
Author: Ruchkin, I.
Sokolsky, O.
Weimer, J.
Hedaoo, T.
Lee, I.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 등재 - Web of Science (SCIE) 조회 - Impact Factor (JCR)

Parameter-Invariant Monitor Design for Cyber–Physical Systems

학술저널

issue: Proceedings of the IEEE Proc. IEEE Proceedings of the IEEE. 106(1):71-92 Jan, 2018
Author: Weimer, J.
Ivanov, R.
Chen, S.
Roederer, A.
Sokolsky, O.
Lee, I.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 등재 - Web of Science (SCIE) 조회 - Impact Factor (JCR)

Design and Implementation of Attack-Resilient Cyberphysical Systems: With a Focus on Attack-Resilient State Estimators

학술저널

issue: IEEE Control Systems IEEE Control Syst. Control Systems, IEEE. 37(2):66-81 Apr, 2017
Author: Pajic, M.
Weimer, J.
Bezzo, N.
Sokolsky, O.
Pappas, G.
Lee, I.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 등재 - Web of Science (SCIE) 조회 - Impact Factor (JCR)

Resiliency in Cyber-Physical Systems [Guest Editors' Introduction]

학술저널

issue: Computer. 51(11):10-12 Nov, 2018
Author: Sokolsky, O.
Bezzo, N.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 등재 - Web of Science (SCIE) 조회 - Impact Factor (JCR)

Automatic verification of linear controller software

회의자료

issue: 2015 International Conference on Embedded Software (EMSOFT) Embedded Software (EMSOFT), 2015 International Conference on. :217-226 Oct, 2015
Author: Pajic, M.
Park, J.
Lee, I.
Pappas, G.J.
Sokolsky, O.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Model-Driven Safety Analysis of Closed-Loop Medical Systems

학술저널

issue: IEEE Transactions on Industrial Informatics IEEE Trans. Ind. Inf. Industrial Informatics, IEEE Transactions on. 10(1):3-16 Feb, 2014
Author: Pajic, M.
Mangharam, R.
Sokolsky, O.
Arney, D.
Goldman, J.
Lee, I.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 등재 - Web of Science (SCIE) 조회 - Impact Factor (JCR) 원문복사신청 - FRIC

Network-Code Machine: Programmable Real-Time Communication Schedules

회의자료

issue: 12th IEEE Real-Time and Embedded Technology and Applications Symposium (RTAS'06) Real-Time and Embedded Technology and Applications Symposium, 2006. Proceedings of the 12th IEEE. :311-324 2006
Author: Fischmeister, S.
Sokolsky, O.
Insup Lee
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

JavaMaC and runtime monitoring for geoinformatics grid services

회의자료

issue: 10th IEEE International Workshop on Object-Oriented Real-Time Dependable Systems Object-Oriented Real-Time Dependable Systems Object-Oriented Real-Time Dependable Systems, 2005. WORDS 2005. 10th IEEE International Workshop on. :105-112 2005
Author: Gates, A.Q.
Roach, S.
Gallegos, I.
Ochoa, O.
Sokolsky, O.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Abstract slicing: a new approach to program slicing based on abstract interpretation and model checking

회의자료

issue: Fifth IEEE International Workshop on Source Code Analysis and Manipulation (SCAM'05) Source Code Analysis and Manipulation Source Code Analysis and Manipulation, 2005. Fifth IEEE International Workshop on. :25-34 2005
Author: Hyoung Seok Hong
Insup Lee
Sokolsky, O.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

RT-MaC: runtime monitoring and checking of quantitative and probabilistic properties

회의자료

issue: 11th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications (RTCSA'05) Embedded and Real-Time Computing Systems and Applications Embedded and Real-Time Computing Systems and Applications, 2005. Proceedings. 11th IEEE International Conference on. :147-153 2005
Author: Sammapun, U.
Insup Lee
Sokolsky, O.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

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