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전체선택

Equivalent DG Dimensions Concept for Compact Modeling of Short-Channel and Thin Body GAA MOSFETs Including Quantum Confinement

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(12):5381-5387 Dec, 2020
Author: Yilmaz, K.
Darbandy, G.
Reimbold, G.
Iniguez, B.
Lime, F.
Kloes, A.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Assessing the Correlation Between Location and Size of Catastrophic Breakdown Events in High-K MIM Capacitors

학술저널

issue: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 19(2):452-460 Jun, 2019
Author: Munoz-Gorriz, J.
Blachier, D.
Reimbold, G.
Campabadal, F.
Sune, J.
Monaghan, S.
Cherkaoui, K.
Hurley, P.K.
Miranda, E.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

On the understanding of cathode related trapping effects in GaN-on-Si Schottky diodes

회의자료

issue: 2017 47th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2017 47th European. :126-129 Sep, 2017
Author: Vandendaele, W.
Lorin, T.
Gwoziecki, R.
Baines, Y.
Biscarrat, J.
Jaud, M.A.
Gillot, C.
Charles, M.
Plissonnier, M.
Reimbold, G.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

About the intrinsic resistance variability in HfO2-based RRAM devices

회의자료

issue: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2017 Joint International EUROSOI Workshop and International Conference on. :31-34 Apr, 2017
Author: Cagli, C.
Piccolboni, G.
Garbin, D.
Grossi, A.
Molas, G.
Vianello, E.
Zambelli, C.
Reimbold, G.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Improved analog performance of SOI Nanowire nMOSFETs Self-Cascode through back-biasing

회의자료

issue: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2017 Joint International EUROSOI Workshop and International Conference on. :83-86 Apr, 2017
Author: Assalti, R.
de Souza, M.
Casse, M.
Barraud, S.
Reimbold, G.
Vinet, M.
Faynot, O.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

A new test vehicle for RRAM array characterization

회의자료

issue: 2017 International Conference of Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2017 International Conference of. :1-4 Mar, 2017
Author: Nguyen, C.
Cagli, C.
Kadura, L.
Nodin, J-F.
Bernasconi, S.
Reimbold, G.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

A microsecond time resolved current collapse test setup dedicated to GaN-based Schottky diode characterization

회의자료

issue: 2017 International Conference of Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2017 International Conference of. :1-4 Mar, 2017
Author: Lorin, T.
Van Den Daele, W.
Gillot, C.
Charles, M.
Biscarrat, J.
Plissonnier, M.
Ghibaudo, G.
Reimbold, G.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Comparative Analysis of Program/Read Disturb Robustness for GeSbTe-Based Phase-Change Memory Devices

회의자료

issue: 2016 IEEE 8th International Memory Workshop (IMW) Memory Workshop (IMW), 2016 IEEE 8th International. :1-4 May, 2016
Author: Castellani, N.
Navarro, G.
Sousa, V.
Zuliani, P.
Annunziata, R.
Borghi, M.
Perniola, L.
Reimbold, G.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Impact of a laser pulse on HfO2-based RRAM cells reliability and integrity

회의자료

issue: 2016 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2016 International Conference on. :152-156 Mar, 2016
Author: Krakovinsky, A.
Bocquet, M.
Wacquez, R.
Coignus, J.
Deleruyelle, D.
Djaou, C.
Reimbold, G.
Portal, J-M.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Robust EOT and effective work function extraction for 14 nm node FDSOI technology

회의자료

issue: 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2016 Joint International EUROSOI Workshop and International Conference on. :135-138 Jan, 2016
Author: Mohamad, B.
Leroux, C.
Rideau, D.
Haond, M.
Reimbold, G.
Ghibaudo, G.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

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