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1

회의자료

issue
2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2024 IEEE International Conference on. :594-599 Oct, 2024
Author
Arpaia, Pasquale
Del Chicca, Irene
De Luca, Matteo
Gargiulo, Ludovica
Mastrati, Giovanna
Moccaldi, Nicola
Morganti, Elisa
Nalin, Marco
Picciafuoco, Mauro
Pierro, Francesca
Rigoni, Filippo
Rigoni, Riccardo
DB Label
Database : IEEE Xplore Digital Library
원문보기
2

회의자료

issue
2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2024 IEEE International Conference on. :588-593 Oct, 2024
Author
Arpaia, Pasquale
De Luca, Matteo
Calce, Anna Della
Carone, Giovanni
Castelli, Nicolo
Duran, Dunja
Gargiulo, Ludovica
Moccaldi, Nicola
Nalin, Marco
Perin, Alessandro
Piccolo, Salvatore
Puttilli, Cosimo
Visani, Elisa
DB Label
Database : IEEE Xplore Digital Library
원문보기
3

회의자료

issue
2024 46th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC) Engineering in Medicine and Biology Society (EMBC), 2024 46th Annual International Conference of the IEEE. :1-4 Jul, 2024
Author
Amrani, Hamza
Micucci, Daniela
Nalin, Marco
Napoletano, Paolo
Rizzi, Ilario
DB Label
Database : IEEE Xplore Digital Library
원문보기
4

회의자료

issue
2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2023 IEEE International Conference on. :652-657 Oct, 2023
Author
Arpaia, Pasquale
Carone, Giovanni
Castelli, Nicolo
D'Errico, Giovanni
Gargiulo, Ludovica
Maffei, Luigi
Mastrati, Giovanna
Moccaldi, Nicola
Nalin, Marco
Perin, Alessandro
Picciafuoco, Mauro
Puttilli, Cosimo
Ramos, Pedro M.
Robbio, Rachele
DB Label
Database : IEEE Xplore Digital Library
원문보기
5

회의자료

issue
2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2023 IEEE International Conference on. :132-137 Oct, 2023
Author
Amrani, Hamza
Micucci, Daniela
Nalin, Marco
Napoletano, Paolo
DB Label
Database : IEEE Xplore Digital Library
원문보기
6

회의자료

issue
2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2023 IEEE International Conference on. :63-67 Oct, 2023
Author
Bonilauri, Augusto
Gervasoni, Elisa
Torchio, Alessandro
Nalin, Marco
Intra, Francesca Sangiuliano
Del Chicca, Irene
Puttilli, Cosimo
Cattaneo, Davide
Baglio, Francesca
DB Label
Database : IEEE Xplore Digital Library
원문보기
7

회의자료

issue
2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2023 IEEE International Conference on. :1075-1080 Oct, 2023
Author
Ceradini, Matteo
Lassi, Michael
Losanno, Elena
Gontran-Massey, Alexander
Nalin, Marco
Del Chicca, Irene
Puttilli, Cosimo
Micera, Silvestro
Bandini, Andrea
DB Label
Database : IEEE Xplore Digital Library
원문보기
8

회의자료

issue
2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2023 IEEE International Conference on. :605-609 Oct, 2023
Author
Arpaia, Pasquale
Calce, Anna Della
Del Chicca, Irene
Gargiulo, Ludovica
Moccaldi, Nicola
Nalin, Marco
Picciafuoco, Mauro
DB Label
Database : IEEE Xplore Digital Library
원문보기
9

회의자료

issue
2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2023 IEEE International Conference on. :1045-1050 Oct, 2023
Author
Seregni, Agnese
Tropea, Peppino
Chiveri, Luca
Huang, Su-Chun
Nalin, Marco
Tacchini, Marta
Del Chicca, Irene
Comi, Giancarlo
Leocani, Letizia
Corbo, Massimo
DB Label
Database : IEEE Xplore Digital Library
원문보기
10

회의자료

issue
2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2023 IEEE International Conference on. :456-461 Oct, 2023
Author
Arpaia, Pasquale
Ayadi, Roberta
Carone, Giovanni
Castelli, Nicolo
Della Calce, Anna
Del Chicca, Irene
Frosolone, Mirco
Gargiulo, Ludovica
Mastrati, Giovanna
Moccaldi, Nicola
Nalin, Marco
Perin, Alessandro
Picciafuoco, Mauro
DB Label
Database : IEEE Xplore Digital Library
원문보기
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