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Benchmarks for SPICE Modeling and Parameter Extraction Based on AI/ML

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 72(4):1551-1559 Apr, 2025
Author: McAndrew, C.C.
Scholten, A.J.
Gullapalli, K.K.
Chauhan, Y.
Xia, K.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Matching Critical Analog Circuit Components Up To Third-Order Gradients for All Possible Exact Matching Ratios

학술저널

issue: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 44(3):845-857 Mar, 2025
Author: Sekyere, M.
Bruce, I.
Yang, R.
Chen, D.
McAndrew, C.C.
Jin, X.
He, C.
Garrity, D.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE)

Improvements to Statistical Characterization and Modeling, and a Caution to be Aware of Spurious Correlation in Statistical Simulation

학술저널

issue: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(7):2252-2263 Jul, 2023
Author: McAndrew, C.C.
Hoseini, M.
Braswell, B.
Garrity, D.A.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE)

The Evolution of Transistor Models: Always trying to keep up with the evolution of transistors

학술저널

issue: IEEE Solid-State Circuits Magazine IEEE Solid-State Circuits Mag. Solid-State Circuits Magazine, IEEE. 15(3):29-35 Jan, 2023
Author: Nagel, L.W.
McAndrew, C.C.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS

Impedance and Effective Resistance of Capacitors With Resistive Top and Bottom Plates

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(10):4834-4841 Oct, 2021
Author: Xia, K.
McAndrew, C.C.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE)

Flicker Noise Formulations in Compact Models

학술저널

issue: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 39(10):2812-2821 Oct, 2020
Author: Coram, G.J.
McAndrew, C.C.
Gullapalli, K.K.
Kundert, K.S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE)

Parameter Extraction for the PSPHV LDMOS Transistor Model

학술저널

issue: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 8:813-824 2020
Author: Xia, K.
McAndrew, C.C.
Van Langevelde, R.
DB Label: Database : IEEE Xplore Digital Library

원문보기: 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE)

PSPHV: A Surface-Potential-Based Model for LDMOS Transistors

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(12):5246-5253 Dec, 2019
Author: Xia, K.
McAndrew, C.C.
Van Langevelde, R.
Smit, G.D.J.
Scholten, A.J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE)

Compact Models for MOS Transistors: Successes and Challenges

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(1):12-18 Jan, 2019
Author: McAndrew, C.C.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE)

JFETIDG: A Compact Model for Independent Dual-Gate JFETs With Junction or MOS Gates

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(2):747-755 Feb, 2018
Author: Xia, K.
McAndrew, C.C.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE)

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