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1
Effect of Carbon Doping Level on Static and Dynamic Properties of AlGaN/GaN Heterostructures Grown on Silicon 미리보기

학술저널

issue
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(8):3192-3198 Aug, 2018
Author
Yacoub, H.
Zweipfennig, T.
Lukens, G.
Behmenburg, H.
Fahle, D.
Eickelkamp, M.
Heuken, M.
Kalisch, H.
Vescan, A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  조회 - Impact Factor (JCR)  등재 - SCOPUS  등재 - Web of Science (SCIE) 
2
Effect of Different Carbon Doping Techniques on the Dynamic Properties of GaN-on-Si Buffers 미리보기

학술저널

issue
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(3):991-997 Mar, 2017
Author
Yacoub, H.
Mauder, C.
Leone, S.
Eickelkamp, M.
Fahle, D.
Heuken, M.
Kalisch, H.
Vescan, A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  조회 - Impact Factor (JCR)  등재 - SCOPUS  등재 - Web of Science (SCIE) 
3
75-nm-T-shaped-gate InAlN/AlN/GaN HEMT on sapphire with 100 GHz cutoff frequency 미리보기

회의자료

issue
2011 6th European Microwave Integrated Circuit Conference Microwave Integrated Circuits Conference (EuMIC), 2011 European. :136-139 Oct, 2011
Author
Lecourt, F.
Defrance, N.
Hoel, V.
De Jaeger, J-C.
Ketteniss, N.
Behmenburg, H.
Eickelkamp, M.
Vescan, A.
Giesen, C.
Heuken, M.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
4
The effect of AlN nucleation growth conditions on the inversion channel formation at the AlN/silicon interface 미리보기

회의자료

issue
2015 73rd Annual Device Research Conference (DRC) Device Research Conference (DRC), 2015 73rd Annual. :175-176 Jun, 2015
Author
Yacoub, H.
Eickelkamp, M.
Fahle, D.
Mauder, C.
Alam, A.
Heuken, M.
Kalisch, H.
Vescan, A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE) 
6
Advanced Modeling of MISHFET Devices and their Performance in Current-Mode Class-D Power Amplifiers 미리보기

회의자료

issue
2008 European Microwave Integrated Circuit Conference Microwave Integrated Circuit Conference, 2008. EuMIC 2008. European. :179-182 Oct, 2008
Author
Cumana, J.
Lautensack, C.
Eickelkamp, M.
Goliasch, J.
Noculak, A.
Vescan, A.
Jansen, R. H.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
7
Processing and characterization of recessed-gate AlGaN/GaN HFETs 미리보기

회의자료

issue
2008 International Conference on Advanced Semiconductor Devices and Microsystems Advanced Semiconductor Devices and Microsystems, 2008. ASDAM 2008. International Conference on. :151-154 Oct, 2008
Author
Kettenib, N.
Eickelkamp, M.
Noculak, A.
Jansen, R.H.
Vescan, A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
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