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전체선택

Hybrid Systems in Foil: Merging the Best of Two Worlds

학술저널

issue: IEEE Electron Devices Magazine IEEE Electron Devices Mag. Electron Devices Magazine, IEEE. 2(2):35-43 Jun, 2024
Author: Burghartz, J.N.
Passlack, U.
Yu, Z.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

A 97-Channel Read-Out ASIC for an Electrophysiological Mapping Catheter With an Optical Link

학술저널

issue: IEEE Transactions on Biomedical Circuits and Systems IEEE Trans. Biomed. Circuits Syst. Biomedical Circuits and Systems, IEEE Transactions on. 18(1):76-88 Feb, 2024
Author: Frank, A.
Kootte, B.
Gottsche, T.
Jutte, P.
Schleipen, J.
Dijkstra, P.
Bihler, E.
Burghartz, J.N.
Anders, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 등재 - Web of Science (SCIE) 조회 - Impact Factor (JCR)

The European Flagship Conferences ESSDERC and ESSCIRC Merge to Become ESSERC [Society News]

학술저널

issue: IEEE Electron Devices Magazine IEEE Electron Devices Mag. Electron Devices Magazine, IEEE. 1(1):58-60 Jun, 2023
Author: Burghartz, J.N.
Steyaert, M.
Claeys, C.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

The European Flagship Conferences ESSDERC and ESSCIRC Merge to Become ESSERC [Conference Reports]

학술저널

issue: IEEE Solid-State Circuits Magazine IEEE Solid-State Circuits Mag. Solid-State Circuits Magazine, IEEE. 15(3):119-121 Jan, 2023
Author: Burghartz, J.N.
Steyaert, M.
Claeys, C.
Malcovati, P.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS

3D Integrated 300°C Tunable RF Oscillator exploiting AlGaN/GaN HEMT for High Temperature Applications

회의자료

issue: 2021 IEEE MTT-S International Microwave Symposium (IMS) Microwave Symposium (IMS), 2021 IEEE MTT-S International. :519-522 Jun, 2021
Author: Palacios, P.
Zweipfennig, T.
Ottaviani, A.
Saeed, M.
Beckmann, C.
Alomari, M.
Lukens, G.
Kalisch, H.
Burghartz, J.N.
Vescan, A.
Negra, R.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Working for William Shockley: In Memoriam: Adolf Goetzberger

학술저널

issue: IEEE Electron Devices Magazine IEEE Electron Devices Mag. Electron Devices Magazine, IEEE. 1(1):25-26 Jun, 2023
Author: Burghartz, J.N.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

A Flexible Chip-Film Patch and a Flexible Strain Gauge Sensor Suitable for a Hybrid System-in-Foil Integration

학술저널

issue: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 21(23):26345-26354 Dec, 2021
Author: Passlack, U.
Elsobky, M.
Mahsereci, Y.
Scherjon, C.
Harendt, C.
Burghartz, J.N.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 등재 - Web of Science (SCIE) 조회 - Impact Factor (JCR)

Model and Simulation of GaN-Based Pressure Sensors for High Temperature Applications—Part I: Physics Based Compact Modeling

학술저널

issue: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 21(18):20165-20175 Sep, 2021
Author: Moser, M.
Pradhan, M.
Alomari, M.
Burghartz, J.N.
DB Label: Database : IEEE Xplore Digital Library

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Model and Simulation of GaN-Based Pressure Sensors for High Temperature Applications—Part II: Sensor Design and Simulation

학술저널

issue: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 21(18):20176-20183 Sep, 2021
Author: Moser, M.
Pradhan, M.
Alomari, M.
Burghartz, J.N.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 등재 - Web of Science (SCIE) 조회 - Impact Factor (JCR)

Backside Illuminated “Ge-on-Si” NIR Camera

학술저널

issue: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 21(17):18696-18705 Sep, 2021
Author: Oehme, M.
Kaschel, M.
Epple, S.
Wanitzek, M.
Yu, Z.
Schwarz, D.
Kollner, A.
Burghartz, J.N.
Schulze, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 등재 - Web of Science (SCIE) 조회 - Impact Factor (JCR)

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